
Marco Pratillo
Marco Pratillo received his M.S. degree in Electrical Engineering from the Polytechnic of Turin (Italy) in 2012. He promptly joins SPEA as part of the Product and Test Engineering Group in Electronic Industries and Custom Semiconductor Test Equipment. Starting from 2017, he relocated to Suzhou (China) as Test Engineering Manager Mems and Power Semiconductor, where he contributed to the exponential growth of the Semiconductor Division, Power and MEMs. He spent five years working closely with the Sales team aiming to affirm and expand the presence of SPEA’s products. In 2022, Marco returned to Italy in the role of Technical Sales Manager, specifically dedicated to the biggest Semiconductor manufacturing leaders in Asia.
MEMS Test Equipment Standardization: New Opportunities for OSATs and IDMs
Testing processes have a relevant impact on the semiconductor manufacturing effectiveness and, at the end, on the final product cost. This is especially true when we talk about MEMS devices, due to the fact that test equipment for MEMS is strongly application-dependent and scarcely reusable for different devices. For many years, both MEMS manufacturers and ATE/Handler suppliers have developed specific test equipment and instruments for every different type of MEMS.
However, having a completely different machine for each different product is becoming less and less efficient, as the number of devices increases exponentially. More and more companies are recognizing the need for a testing and handling solution that is suitable for the requirements of high-volume production lines, scalable, and convertible for different application technologies.
A standard test setup for MEMS includes a handler, test resources, and an interchangeable test unit able to stimulate the devices during the execution of the electrical test. The same test cell can accommodate the test units for testing different products, such as pressure sensors, accelerometer, gyroscopes, microphones, magnetic sensors, and many others.
The presentation explores the new opportunities offered by this integrated approach, focusing on the advantages – in terms of cost of test, performance and ROI. Specific application case studies will be presented, dedicated to inertial, pressure, and magnetic sensor testing.

SPEA
Established in 1976, SPEA is a world leading company in the field of automatic test equipment for ICs, MEMS, sensors, electronic boards. SPEA serves the big semiconductor IDMs and OSATs with the most cost-effective and high-performance equipment to test automotive, SoCs, analog mixed-signal devices, MEMS sensors and actuators, power and discretes, identification devices, delivering highest measurement capabilities, lowest cost of test and fastest time-to-market. SPEA systems are designed to detect any possible defect in electronic products, so that they won’t fail on the field. High throughput, best detection capability, test techniques designed on the latest technologies requirements, complete configurability. For SPEA customers, testing is not an additional cost, but a tangible competitive advantage.
MWS EU 2022 Agenda
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Dr. Stefan Majoni
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Pat Walsh
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Angeline Tee
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Maksym Plakhotnyuk, Ph.D.
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Alex Waldauf
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Maurus Tschirky
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Dr. Sandro Koch
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Dr. Michael Pate
Mobile Audio Systems, Algo, Architecture Lead
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Erwin Hijzen
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Matan Naftali
CEO
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Thomas Russell
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Giuseppina Saracco
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Senni Laaksonen
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Eric Aguilar
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Mike Rosa
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Dr. David Leuenberger
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Giacomo Tonti
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Jon Edwards
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Dr. Mohssen Moridi
Head of Research Division Microsystems
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Matthieu Lacolle
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sensiBel

Farrokh Ayazi
Founder & CEO
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Collin Twanow
Director, Technology
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Moti Margalit
CEO
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Higor Batagin
Sales Manager Semi & MEMS Test Equipment
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Anton Hofmeister
Group Vice President – General Manager R&D and Strategy
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Ahmed Ben Slimane
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Dr. Manuel Dorfmeister
Head of MEMS and e-Software department
TriLite

Dr. Koukou Suu
Executive Officer and Senior Fellow of ULVAC, Inc / President and CEO of ULVAC Technologies, Inc
ULVAC

Dimitrios Damianos
Project Manager, Consulting Services Division
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