2022 世界微机电系统欧洲峰会讲师

Ari Kuukkala

AEM Afore Oy
General Manager

简介

Ari has 15 years of experience in automation and MEMS device test holding several positions in Afore. He joined Afore in 2006 as mechanical design engineer for sensor test equipment, and later worked in field service and research & development. Before taking his current position as AEM AFORE GM in 2020, Ari was responsible for all sales and marketing activities in Afore. He successfully expanded the Afore business outside of its domestic market and managed sales partners in USA, Asia and Europe.

As General Manager of the AEM AFORE Product Line, Ari Kuukkala is responsible to expand the Wafer Test Solutions business unit within existing and new customers. In close cooperation with CTO office and other product lines, Ari is responsible to bring new products to market, find new application areas to support growth and serve special application areas in semiconductor wafer test.

演讲内容

Improving Time to Market Using Probe Stations with Physical Stimulus

Today, MEMS and sensor manufacturer struggle with the need to shorten time-to-market while reducing development costs at the same time. Productivity, yield and performance may not be compromised to stay ahead in a competitive environment.

Design flaws introduced by immature design can result in increased manufacturing cost as well as decreased product quality.

The presentation outlines how to gain faster time-to-market by characterizing devices with real stimulus during device design, utilize this data to optimize design and manufacturability, and transfer test knowledge gained during characterization to low- and high-volume production.

公司简介

AEM Afore Oy

Pioneers in MEMS Wafer and Strip Level Final Test and Calibration

Afore Wafer Level Test Solutions are a key offering under AEM’s Test Cells Solutions Business that has established leadership positions in developing and deploying application-specific test solutions for MEMS devices and offering wafer and frame probing stations suitable for R&D, wafer sort, and Final Test.

For more than two decades our test solutions drive innovation by applying accurate physical stimulus to motion and environmental sensors. Today, the AIOLOS, KRONOS and MPP probing platforms allow state-of-the-art test and calibration of MEMS sensors at wafer level as well as strip level for LGA, QFN and BGA packages.

Our 300mm cryogenic probe station advances quantum computing by allowing volume testing of innovative technologies at cryogenic temperatures.

About AEM

AEM is a global leader in test innovation. With full-stack test capabilities for advanced engineering to high-volume manufacturing, AEM provides innovative test solutions to drive successful customer outcomes in innovation by redefining test through its Test Cell Solutions Business and Instrumentation Business.